Foreign Object Debris Inside Pin

Foreign Object Debris Inside Pin Indicator can be from many sources including re-tinning, re-balling, carrier tape, trays used and many other reasons. Originally manufactured devices normally do not have debris or foreign material inside a pin indicator. This is just one reason to let Global ETS perform an external visual inspection. With our state of the art High Definition Keyence Microscope locating anomalies is easier and pictures are clear.

FOD Inside Pin Indicator Foreign Object Debris Inside Pin
Test Dots Inside Pin Inconsistent size and position of pin one indicator
FOD in Pin on Component Foreign Material on the bottom of semiconductor