Parametric tests are performed over a range of operating temperatures to measure dc and ac parameters of a chip. The objective of parametric testing is to determine the quality of each product to avoid counterfeit distribution and production. This is accomplished by running a suite of tests or as many vital tests as possible to check the dc, ac, and parametric performance of the component in question.
Global ETS offers wide range of components testing from basic DC limited function to full DC/AC function test at temperature including up-screening of all type of devices. We are equipped with a wide variety of digital and linear test equipment to verify electrical operating conditions of active, passive, and discrete components utilized on various electronic assemblies. Typically, our clients specify different environmental test conditions depending on industry compliance requirements (i.e., Military, Automotive, Medical, etc.).
Global ETS use PXI system, powered by national instrument and keysight which can be integrated to perform an assortment of component level tests.
PXI systems provide high-performance modular instruments and other I/O modules that feature specialized synchronization and key software features for test and measurement applications from device validation to automated production test.
Software development by Global ETS for Automatic test parametric of capacitor